Simultaneous imaging of Si(111) 7×7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact mode

• Peter Güthner

  Omicron Vakuumphysik GmbH D-65232, Taunusstein, Germany

Abstract

The reconstructed Si (111) 7×7 surface was imaged in several operation modes of the combined ultrahigh vacuum atomic force microscope/scanning tunnel microscope. By imaging single atom defects on the sample surface a clear proof of the atomic resolution in noncontact mode of the force microscope was possible. By simultaneous measurements of several interaction parameters and by the investigation of force-distance curves, it was possible to explain the origin of the interaction.

Journal

• Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

  Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 14 (4), 2428-2431, 1996-07-01

  American Vacuum Society

Keywords

• Electrical and Electronic Engineering
• Condensed Matter Physics

Details

• CRID: 1363670319239813632
• NII Article ID: 30020313682
• NII Book ID: AA10635514
• DOI: 10.1116/1.588873
• ISSN: 15208567
• ISSN: 10711023
• Web Site: https://pubs.aip.org/avs/jvb/article-pdf/14/4/2428/11823493/2428_1_online.pdf
• Data Source:
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  • CiNii Articles