Elasticity, wear, and friction properties of thin organic films observed with atomic force microscopy

• R. M. Overney

  Institute of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland

• T. Bonner

  Institute of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland

• E. Meyer

  Institute of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland

• M. Rüetschi

  Institute of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland

• R. Lüthi

  Institute of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland

• L. Howald

  Institute of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland

• J. Frommer

  Institute of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland

• H.-J. Güntherodt

  Institute of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland

• M. Fujihira

  Department of Bimolecular Engineering, Tokyo Institute of Technology, Nagatsuta, Midori-ku, Yokohama 227, Japan

• H. Takano

  Department of Bimolecular Engineering, Tokyo Institute of Technology, Nagatsuta, Midori-ku, Yokohama 227, Japan

Abstract

An atomic force microscopy study is presented on lubricating systems, such as thin organic Langmuir–Blodgett films. Local elastic compliance was measured simultaneously with topography and friction on thin films of mixtures of fluorocarbons and hydrocarbons. On the phase-separated fluorocarbon domains, higher friction and lower Young’s modulus than on the hydrocarbon domains was found. Adhesive wear has been observed to occur randomly on the stiffer hydrocarbon domains if the film is complexed with a counterion polymer of a larger cross-sectional area. A quantitative fractal analysis of the hydrocarbon film remaining areas provided a linear adhesive wear dependence on the scan cycle number.

Journal

• Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

  Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 12 (3), 1973-1976, 1994-05-01

  American Vacuum Society

Keywords

• Electrical and Electronic Engineering
• Condensed Matter Physics

Details

• CRID: 1363388846230081024
• NII Article ID: 30020321577
• DOI: 10.1116/1.587682
• ISSN: 15208567
• ISSN: 10711023
• Web Site: https://pubs.aip.org/avs/jvb/article-pdf/12/3/1973/12120546/1973_1_online.pdf
• Data Source:
  • Crossref
  • CiNii Articles