Fine Surface lmages That Reflect Cytoskeletal Structures in Cultured Glid Cells by Atomic Force Microscopy
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- Yamane Yukako
- Divisions of Biological Sciences. Graduate School of Science, Hokkaido University, Kita–ku, Sapporo 060, Japan
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- Hatakeyama Dai
- Divisions of Biological Sciences. Graduate School of Science, Hokkaido University, Kita–ku, Sapporo 060, Japan
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- Tojima Takuro
- Divisions of Biological Sciences. Graduate School of Science, Hokkaido University, Kita–ku, Sapporo 060, Japan
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- Kawabata Kazushige
- Divisions of Biological Physics, Graduate School of Science, Hokkaido University, Kita–ku, Sapporo 060, Japan
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- Ushiki Tatsuo
- Department of Anatomy and Histology, Niigata University School of Medicine, Asahimachi–dori, Niigata 951, Japan
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- Ogura Shigeaki
- Departments of Medicine. Hokkaido University School of Medicine, Kita–ku, Sapporo 060, Japan
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- Abe Kazuhiro
- Departments of Anatomy, Hokkaido University School of Medicine, Kita–ku, Sapporo 060, Japan
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- Ito Etsuro
- Divisions of Biological Sciences. Graduate School of Science, Hokkaido University, Kita–ku, Sapporo 060, Japan
書誌事項
- タイトル別名
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- Fine Surface Images That Reflect Cytoskeletal Structures in Cultured Glial Cells by Atomic Force Microscopy.
- Fine Surface lmages That Reflect Cytosk
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抄録
The morphology of cultured glial cells was examined using a combination of atomic force microscopy (AFM) and immunofluorescence staining for cytoskeletons. The meshwork of type-1 astrocytes consisted of thick longitudinal and thin lateral lines on the cell surfaces observed by AFM; the former lines were confirmed to be reflections of actin filaments. The astrocytic processes of type-2 astrocytes were observed to be rugged on AFM. These structures were mainly affected by microtubules. Immunofluorescence imaging of microglia revealed that actin filaments and microtubules were arranged radially and wavily along the cell edge, respectively. AFM could detect these radial and wavy structures clearly. These results show that AFM can provide information on the cytoskeletons of glial cells, indicating that AFM is a useful tool for the morphological characterization of cells.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 37 (6B), 3849-3854, 1998
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390282681228346496
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- NII論文ID
- 210000043395
- 30021831489
- 110003947495
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- NII書誌ID
- AA10457675
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- COI
- 1:CAS:528:DyaK1cXkvVyrtrY%3D
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 4526390
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可