A New Fabrication Process for Low-Loss Millimeter-Wave Transmission Lines on Silicon.
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- Ishii Hiromu
- NTT Telecommunications Energy Laboratories, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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- Sahri Nabil
- NTT Telecommunications Energy Laboratories, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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- Nagatsuma Tadao
- NTT Telecommunications Energy Laboratories, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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- Machida Katsuyuki
- NTT Telecommunications Energy Laboratories, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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- Saito Kunio
- NTT Telecommunications Energy Laboratories, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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- Yagi Shouji
- NTT Telecommunications Energy Laboratories, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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- Yano Masaki
- NTT Advanced Technology Corporation, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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- Kudo Kazuhisa
- NTT Advanced Technology Corporation, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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- Kyuragi Hakaru
- NTT Telecommunications Energy Laboratories, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
書誌事項
- タイトル別名
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- New Fabrication Process for Low Loss Millimeter Wave Transmission Lines on Silicon
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抄録
The new type of coplanar waveguide for millimeter-wave transmission was fabricated on silicon by chemical mechanical polishing and selective electroplating processes based on silicon technology. The thick interconnections obtained using these processes have less conductor loss than the conventional interconnections, and the deep grooves on both sides of a signal line in this new waveguide reduce the dielectric loss caused by the high permittivity of the silicon substrate. The electro-optic sampling technique confirmed that the new waveguide has excellent millimeter-wave propagation characteristics, low effective permittivity and low attenuation, at frequencies up to 300 GHz. The new fabrication processes should be useful in combining millimeter-wave systems with ultralarge-scale integrated circuits on silicon.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 39 (4B), 1982-1986, 2000
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390001206251165312
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- NII論文ID
- 110004078265
- 30021834481
- 130004527369
- 210000046979
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- NII書誌ID
- AA10457675
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 5384424
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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- 抄録ライセンスフラグ
- 使用不可