Observation of a 0.055 nm Spacing Lattice Image in Gold using a Field Emission Electron Microscope
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<jats:p> A 350 kV electron microscope equipped with a magnetic-field-superimposed field emission gun has been developed. A 0.055 nm-spacing lattice image in a gold thin film has been successfully observed with this electron microscope under the condition of 300 kV electron accelerating voltage. </jats:p>
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 29 (3A), L508-, 1990-03-01
IOP Publishing
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詳細情報
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- CRID
- 1360847871770656128
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- NII論文ID
- 30021858317
- 210000029940
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- NII書誌ID
- AA10457675
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- ISSN
- 13474065
- 00214922
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- データソース種別
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