Enhancing testability of largescale integrated circuits via test points and additional logic

• WILLIAMS M. J. Y.

収録刊行物

• IEEE Trans. Comput.

  IEEE Trans. Comput. 22 (1), 46-60, 1973

詳細情報

• CRID: 1570291226463414912
• NII論文ID: 30028413541
• DOI: 10.1109/t-c.1973.223600
• データソース種別:
  • CiNii Articles