Semi-quantitative Characterization of Voids Carbon Fibres by X-ray Small Angle Scattering

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  • Semi-quantitative Characterization of Voids in Carbon Fibres by X-ray Small Angle Scattering
  • Semi quantitative Characterization of V

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抄録

Plots of the inverse square root of X-ray small angle scattering intensity against square of scattering angle are known to be linear for many carbon fibres. Sometimes, however, the linearity is limited only in its high angle region and the plots deviate gradually from the straight line downwards.For the former type of the carbon fibres the void structure is well approximated with a Maxwellian, but not so for the latter because the assessed values of the Maxwellian parameters for a given specimen vary from one analytical procedure to another. This paper suggests a procedure to characterize the void structure in the latter sort of carbon fibre in a more convenient way than used in the past.It is based on the assumption that the observed scattering is caused by a void structure in a composite of two Maxwellians, one of which is represented by the straight line seen in the high angle region of the plots mentioned above.

収録刊行物

  • 炭素

    炭素 1980 (103), 143-148, 1980

    炭素材料学会

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