Atomic structure observation of silicon carbide using HRTEM

• Eriko Takuma

• Hideki Ichinose

• Fu-Rong Chen

Journal

• Journal of electron microscopy

  Journal of electron microscopy 51 (5), 297-302, 2002

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Keywords

• atomic resolution TEM
• chemical structure image
• maximum entropy method
• projected potential imaging

Details

• CRID: 1523951030590438912
• NII Article ID: 40005586302
• NII Book ID: AA00697060
• ISSN: 00220744
• NDL BIB ID: 6342392
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I6342392
• Text Lang: en
• NDL Source Classification:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• Data Source:
  • NDL
  • CiNii Articles