Transmission electron microscopy characterization of position-controlled InN nanocolumns

• Satoshi Harui

• Hidetoshi Tamiya

• Takanobu Akagi

Bibliographic Information

Other Title

• Transmission electron microscopy characterization of position controlled InN nanocolumns

Abstract

コレクション : 国立国会図書館デジタルコレクション > デジタル化資料 > 雑誌

Journal

• Japanese journal of applied physics : JJAP

  Japanese journal of applied physics : JJAP 47 (7), 5330-5332, 2008-07

  Tokyo : The Japan Society of Applied Physics

Keywords

• InN
• GaN
• nanocolumn
• dislocation
• polarity
• CBED
• TEM
• ECR-MBE
• RF-MBE

Details

• CRID: 1520572357888472064
• NII Article ID: 40016161747
• NII Book ID: AA12295836
• ISSN: 00214922
• ISSN: 13474065
• ISSN: http://id.crossref.org/issn/13474065
• DOI: 10.1143/jjap.47.5330
• NDL BIB ID: 9585182
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I9585182
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.47.5330
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.47.5330/pdf
• Text Lang: en
• NDL Source Classification:
  • ZM35(科学技術--物理学)
• Data Source:
  • NDL
  • Crossref
  • CiNii Articles