Characterization of intrinsic defects in high-purity high-resistivity p-type 6H-SiC

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Journal

  • Japanese journal of applied physics

    Japanese journal of applied physics 47(9), 7052-7055, 2008-09

    IOP Publishing

Cited by:  1

Codes

  • NII Article ID (NAID)
    40016294912
  • Text Lang
    ENG
  • Article Type
    Journal Article
  • Journal Type
    大学紀要
  • ISSN
    00214922
  • NDL Article ID
    9652002
  • NDL Source Classification
    ZM35(科学技術--物理学)
  • NDL Call No.
    Z53-A375
  • Data Source
    CJPref  NDL  Crossref 
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