Single-electron-resolution electrometer based on field-effect transistor

• Katsuhiko Nishiguchi

• Charlie Koechlin

• Yukinori Ono

Bibliographic Information

Other Title

• Single electron resolution electrometer based on field effect transistor

Abstract

コレクション : 国立国会図書館デジタルコレクション > デジタル化資料 > 雑誌

Journal

• Japanese journal of applied physics : JJAP

  Japanese journal of applied physics : JJAP 47 (11), 8305-8310, 2008-11

  Tokyo : The Japan Society of Applied Physics

Keywords

• single electron
• electrometer
• high charge sensitivity
• Si field-effect transistor

Details

• CRID: 1520572359394835840
• NII Article ID: 40016346937
• NII Book ID: AA12295836
• ISSN: 00214922
• ISSN: 13474065
• ISSN: http://id.crossref.org/issn/13474065
• DOI: 10.1143/jjap.47.8305
• NDL BIB ID: 9714135
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I9714135
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.47.8305
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.47.8305/pdf
• Text Lang: en
• NDL Source Classification:
  • ZM35(科学技術--物理学)
• Data Source:
  • NDL
  • Crossref
  • CiNii Articles