Analysis of threshold voltage variation in fin field effect transistors: separation of short channel effects

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Journal

  • Japanese journal of applied physics

    Japanese journal of applied physics 49(4), 044201-1〜6, 2010-04

    Japan Society of Applied Physics

Codes

  • NII Article ID (NAID)
    40017085077
  • NII NACSIS-CAT ID (NCID)
    AA12295836
  • Text Lang
    ENG
  • Journal Type
    大学紀要
  • ISSN
    00214922
  • NDL Article ID
    10653660
  • NDL Source Classification
    ZM35(科学技術--物理学)
  • NDL Call No.
    Z53-A375
  • Data Source
    NDL  Crossref 
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