Electric field induced carrier sweep-out in tandem InGaN multi-quantum-well self-pulsating laser diodes
書誌事項
- タイトル別名
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- Electric field induced carrier sweep out in tandem InGaN multi quantum well self pulsating laser diodes
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抄録
<jats:p> Mechanisms of carrier sweep-out in tandem InGaN multiple-quantum-well self-pulsating laser diodes were investigated. Laser diodes showed self-pulsating characteristics without significant change in the light output–current (<jats:italic>I</jats:italic>–<jats:italic>L</jats:italic>) characteristics when an electric field high enough was established in the saturable absorber by the applied reverse bias. Improvements in the design of the band-energy profile allowed a substantial reduction in the bias required for self-pulsating operation. These results indicate that carrier lifetime can be controlled by the electric field in the saturable absorber and that band-energy profile engineering is effective for the reduction of carrier lifetime. </jats:p>
収録刊行物
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- Japanese journal of applied physics : JJAP
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Japanese journal of applied physics : JJAP 50 (2), 020209-, 2011-02
Tokyo : The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1520009407354941696
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- NII論文ID
- 40018283285
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- NII書誌ID
- AA12295836
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- ISSN
- 00214922
- 13474065
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- NDL書誌ID
- 10981558
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- 本文言語コード
- en
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- NDL 雑誌分類
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- ZM35(科学技術--物理学)
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- データソース種別
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- NDL
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