Nondestructive Measurement of Nonlinear Conduction of Nanoscale Materials, Nanoscale SiO₂, and K0.3MoO₃ by Pulse Photoconductivity Method

• Yuya Nishi

• Toshimasa Hirano

• Yuki Soh

収録刊行物

• Japanese journal of applied physics : JJAP

  Japanese journal of applied physics : JJAP 50 (11), 116602-, 2011-11

  Tokyo : The Japan Society of Applied Physics

キーワード

• General Physics and Astronomy
• Physics and Astronomy (miscellaneous)
• General Engineering

詳細情報

• CRID: 1520853832433171840
• NII論文ID: 40019072897
• NII書誌ID: AA12295836
• ISSN: 00214922
• ISSN: 13474065
• DOI: 10.7567/jjap.50.116602
• NDL書誌ID: 023320691
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I023320691
• 本文言語コード: en
• NDL 雑誌分類:
  • ZM35(科学技術--物理学)
• データソース種別:
  • NDL
  • Crossref
  • CiNii Articles