Matching-Circuit-Integrated InGaAsP Schottky Barrier Diode for Zero-Biased Operation in the Sub-Millimeter-Wave Range
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<jats:p> An InP/InGaAsP Schottky barrier diode (SBD) for zero-biased operation in the sub-millimeter-wave range has been designed and fabricated. The SBD is monolithically integrated with a short-stub resonant matching circuit to increase the detection sensitivity around the designated frequency as well as to provide a biasing circuit. The fabricated device exhibits a small Schottky barrier height of about 0.37 eV, which is suitable for zero-biased operation. The SBD chip is mounted in a compact J-band (WR-3) rectangular-waveguide-input module to evaluate the high-frequency characteristics. The module exhibits a peak sensitivity at around 350 GHz due to the characteristics of the matching circuit, and good linearity of the output voltage against the input sub-mm-wave power. A record sensitivity of 1460 V/W at 350 GHz is obtained for the InP-based zero-biased SBD. </jats:p>
収録刊行物
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- Japanese journal of applied physics : JJAP
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Japanese journal of applied physics : JJAP 51 (11), 114101-, 2012-11
Tokyo : The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1520009408870844288
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- NII論文ID
- 40019496079
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- NII書誌ID
- AA12295836
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- ISSN
- 00214922
- 13474065
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- NDL書誌ID
- 024102897
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- 本文言語コード
- en
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- NDL 雑誌分類
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- ZM35(科学技術--物理学)
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- データソース種別
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- NDL
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