Analysis of Kohn-Sham Eigenfunctions Using a Convolutional Neural Network in Simulations of the Metal-Insulator Transition in Doped Semiconductors
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Journal
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- Journal of the Physical Society of Japan
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Journal of the Physical Society of Japan 90 (9), 094001-, 2021-09
Tokyo : Physical Society of Japan
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Details 詳細情報について
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- CRID
- 1521980706152044928
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- NII Article ID
- 40022680219
- 210000159249
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- NII Book ID
- AA00704814
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- ISSN
- 00319015
- 13474073
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- NDL BIB ID
- 031677553
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- Text Lang
- en
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- NDL Source Classification
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- ZM35(科学技術--物理学)
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- Data Source
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- NDL
- Crossref
- CiNii Articles
- KAKEN