Studies on industrial sampling inspection plans and the support system 工場生産における抜取検査方式と設計支援システムの研究開発

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Author

    • 木村, 宏 キムラ, ヒロシ

Bibliographic Information

Title

Studies on industrial sampling inspection plans and the support system

Other Title

工場生産における抜取検査方式と設計支援システムの研究開発

Author

木村, 宏

Author(Another name)

キムラ, ヒロシ

University

九州大学

Types of degree

理学博士

Grant ID

乙第4918号

Degree year

1991-03-27

Note and Description

博士論文

Table of Contents

  1. CONTENTS / p1 (0003.jp2)
  2. Chapter 1 Introduction / p1 (0006.jp2)
  3. 1.1 Purpose of the article / p1 (0006.jp2)
  4. 1.2 Construction of the article / p3 (0008.jp2)
  5. Part I Industrial Sampling Inspection Plans / p5 (0010.jp2)
  6. Chapter 2 Single and double stage sampling inspection plans / p6 (0011.jp2)
  7. 2.1 Preliminaries / p6 (0011.jp2)
  8. 2.2 Plans for exponential distributions / p17 (0022.jp2)
  9. 2.3 Plans for Weibull distributions / p19 (0024.jp2)
  10. 2.4 Plans for uniform distributions / p26 (0031.jp2)
  11. Chapter 3 Multi-stage sampling inspection plans / p27 (0032.jp2)
  12. 3.1 Preliminaries / p27 (0032.jp2)
  13. 3.2 Plans for exponential distributions / p30 (0035.jp2)
  14. 3.3 Plans for Weibull distributions / p32 (0037.jp2)
  15. 3.4 Plans for uniform distributions / p39 (0044.jp2)
  16. Chapter 4 Sampling inspection plans with adjustment / p41 (0046.jp2)
  17. 4.1 Introduction / p41 (0046.jp2)
  18. 4.2 Static properties of ISO-3951 plans / p48 (0053.jp2)
  19. 4.3 Dynamic properties of ISO-3951 plans / p65 (0070.jp2)
  20. 4.4 Modification of ISO-3951 plans / p74 (0079.jp2)
  21. Part II The Support System―Micro-NISAN / p90 (0095.jp2)
  22. Chapter 5 Introduction / p91 (0096.jp2)
  23. 5.1 Brief review of statistical softwares / p91 (0096.jp2)
  24. 5.2 Design principle of Micro-NISAN system / p95 (0100.jp2)
  25. Chapter 6 System construction / p97 (0102.jp2)
  26. 6.1 System capacity / p97 (0102.jp2)
  27. 6.2 Special features / p98 (0103.jp2)
  28. 6.3 Summary of functions / p100 (0105.jp2)
  29. 6.4 Commands / p103 (0108.jp2)
  30. Chapter 7 Control and management procedures / p109 (0114.jp2)
  31. 7.1 Operation process / p109 (0114.jp2)
  32. 7.2 Command selection mechanism / p113 (0118.jp2)
  33. Chapter 8 Knowledge commands for sampling inspection plans / p116 (0121.jp2)
  34. 8.1 SIMTST command / p116 (0121.jp2)
  35. 8.2 TPTST command / p119 (0124.jp2)
  36. 8.3 CTSPSAV command / p121 (0126.jp2)
  37. 8.4 CTPSAVS command / p122 (0127.jp2)
  38. 8.5 ISOOC command / p123 (0128.jp2)
  39. 8.6 Other commands related to sampling inspection plans / p124 (0129.jp2)
  40. Chapter 9 Conclusion / p129 (0134.jp2)
  41. Acknowledgements / p131 (0136.jp2)
  42. References / p132 (0137.jp2)
2access

Codes

  • NII Article ID (NAID)
    500000075615
  • NII Author ID (NRID)
    • 8000000075814
  • DOI(NDL)
  • NDLBibID
    • 000000239929
  • Source
    • NDL ONLINE
    • NDL Digital Collections

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