Microscopic investigation surfaces/interfaces by the scanning tunneling microscope and ballistic electron emission microscope 走査トンネル顕微鏡と弾道電子放射顕微鏡による表面・界面の研究

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Title: Microscopic investigation surfaces/interfaces by the scanning tunneling microscope and ballistic electron emission microscope

博士論文

TABLE OF CONTENTS / p3 (0004.jp2)
ACKNOWLEDGMENTS / p2 (0003.jp2)
ABSTRACT / p5 (0006.jp2)
LIST OF FIGURES / p8 (0009.jp2)
1.INTRODUCTION / p1 (0016.jp2)
2.SCANNING TUNNELING MICROSCOPY(STM) / p5 (0020.jp2)
2.1 PRINCIPLE OF STM / p5 (0020.jp2)
2.2 THEORY / p6 (0021.jp2)
2.3 INSTRUMENTATION OF STM / p17 (0032.jp2)
3.SCANNING TUNNELING SPECTROSCOPY(STS)ON Si(111)7x7 SURFACE / p39 (0054.jp2)
3.1 PRINCIPLE OF STS / p39 (0054.jp2)
3.2 Si(111)7x7 SURFACE / p42 (0057.jp2)
3.3 STS ON Si(111)7x7 SURFACE / p47 (0062.jp2)
3.4 COMMENTS ON STS / p57 (0072.jp2)
4.STM/STS ON ATOMIC-HYDROGEN CHEMISORBED Si(111)7x7 SURFACE / p59 (0074.jp2)
4.1 INTRODUCTION / p59 (0074.jp2)
4.2 EXPERIMENTAL / p66 (0081.jp2)
4.3 RESULTS AND DISCUSSION / p68 (0083.jp2)
4.4 CONCLUSIONS / p90 (0105.jp2)
5.BEEM ON NiSi₂/Si(111) INTERFACE / p92 (0107.jp2)
5.1 BALLISTIC ELECTRON EMISSION MICROSCOPY(BEEM) / p92 (0107.jp2)
5.2 NiSi₂/Si(111)INTERFACE AND NiSi₂(111)SURFACE / p109 (0124.jp2)
5.3 BEEM RESULTS ON THE NiSi₂/Si(111)INTERFACE / p134 (0149.jp2)
5.4 DISCUSSION / p144 (0159.jp2)
5.5 CONCLUSIONS / p149 (0164.jp2)
6.CONCLUSIONS / p152 (0167.jp2)
BIBLIOGRAPHY / p154 (0169.jp2)

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