Measurement of semi-leptonic decay width Γ(D[0]→K[-]μ[+]ν[μ]) セミレプトニック崩壊Γ(D[0]→K[-]μ[+]ν[μ])における崩壊幅の測定
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Bibliographic Information
- Title
-
Measurement of semi-leptonic decay width Γ(D[0]→K[-]μ[+]ν[μ])
- Other Title
-
セミレプトニック崩壊Γ(D[0]→K[-]μ[+]ν[μ])における崩壊幅の測定
- Author
-
渡辺, 尚治
- Author(Another name)
-
ワタナベ, ショウジ
- University
-
東邦大学
- Types of degree
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理学博士
- Grant ID
-
甲第152号
- Degree year
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1992-03-16
Note and Description
博士論文
Table of Contents
- ABSTRACT / (0003.jp2)
- Contents / p4 (0007.jp2)
- ACKNOWLEDGEMENTS / p2 (0005.jp2)
- LIST OF FIGURES / p7 (0010.jp2)
- LIST OF TABLES / p9 (0012.jp2)
- 1 INTRODUCTION / p1 (0013.jp2)
- 1.1 The Status of Weak Decay in High Energy Physics / p1 (0013.jp2)
- 1.2 Progress of Charm Physics with Emulsion Target / p2 (0014.jp2)
- 2 THEORY OF WEAK DECAY / p5 (0017.jp2)
- 2.1 Introduction / p5 (0017.jp2)
- 2.2 Quarks and Leptons / p6 (0018.jp2)
- 2.3 Weak Interaction / p7 (0019.jp2)
- 2.4 Cabibbo-Kobayashi-Maskawa Matrix / p8 (0020.jp2)
- 2.5 Spectator Quark Model / p10 (0022.jp2)
- 2.6 Kinematics of P→Xℓν / p11 (0023.jp2)
- 2.7 Form Factor / p12 (0024.jp2)
- 2.8 Model Calculations for Partial Width / p13 (0025.jp2)
- 3 DESCRIPTION OF THE E653 EXPERIMENT / p16 (0028.jp2)
- 3.1 Experimental Apparatus / p16 (0028.jp2)
- 3.2 Counter System / p28 (0040.jp2)
- 3.4 Emulsion Analysis System / p42 (0054.jp2)
- 4 METHODS OF EMULSION ANALYSIS / p56 (0068.jp2)
- 4.1 Outline of Nuclear Emulsion Analysis / p56 (0068.jp2)
- 4.2 Flow Chart of Emulsion Scanning Procedures / p60 (0072.jp2)
- 4.3 Event Location / p64 (0076.jp2)
- 4.4 Decay Search / p67 (0079.jp2)
- 5 SUMMARY OF DATA / p77 (0089.jp2)
- 5.1 Event Summary / p77 (0089.jp2)
- 5.2 List of Background in Decay Candidates / p81 (0093.jp2)
- 5.3 Estimation of Neutral Backgrounds / p83 (0095.jp2)
- 6 ANALYSIS OF CHARM DECAYS / p86 (0098.jp2)
- 6.1 Introduction / p86 (0098.jp2)
- 6.2 Analysis of Muon Transverse Momentum Distribution / p87 (0099.jp2)
- 6.3 Analysis of Mass Distribution / p99 (0111.jp2)
- 7 EXPERIMENTAL RESULTS AND DISCUSSION / p106 (0118.jp2)
- 7.1 The Fraction ƒ / p106 (0118.jp2)
- 7.2 Decay Width of D⁰→K⁻μ⁺νμ / p117 (0129.jp2)
- 7.3 Vcs;C-K-M Matrix Element / p118 (0130.jp2)
- 7.4 Form Factor / p119 (0131.jp2)
- 7.5 Semi-electronic Decay Mode / p119 (0131.jp2)
- 8 CONCLUSIONS / p121 (0133.jp2)
- 8.1 Beam Exposure and Target Mover Control / p122 (0134.jp2)
- 8.2 Constructions of Semi-automated Microscope Stage and its Interface / p122 (0134.jp2)
- 8.3 Evaluation of Relative Branching Fraction of D⁰→K⁻μ⁺νμ / p123 (0135.jp2)
- 8.4 C-K-M Matrix Element and Form Factor / p124 (0136.jp2)
- 8.5 Future Prospects / p124 (0136.jp2)
- SUMMARY OF EVENT SAMPLE / p126 (0138.jp2)
- REFERENCES / p131 (0143.jp2)