Threshold current density reduction of GaInAsP/InP surface emitting lasers by improving mirror reflectivity 高反射率化によるGaInAsP/InP面発光レーザのしきい値電流密度の低減

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Author

    • 押切, 光丈 オシキリ, ミツタケ

Bibliographic Information

Title

Threshold current density reduction of GaInAsP/InP surface emitting lasers by improving mirror reflectivity

Other Title

高反射率化によるGaInAsP/InP面発光レーザのしきい値電流密度の低減

Author

押切, 光丈

Author(Another name)

オシキリ, ミツタケ

University

東京工業大学

Types of degree

工学博士

Grant ID

甲第2475号

Degree year

1992-03-26

Note and Description

博士論文

Table of Contents

  1. 論文目録 / (0002.jp2)
  2. Abstract / (0008.jp2)
  3. Chapter 1 Introduction / p1 (0010.jp2)
  4. 1.1 Background / p1 (0010.jp2)
  5. 1.2 Surface Emitting Lasers / p4 (0013.jp2)
  6. 1.3 Purpose of This Study and Conetnt of This Thesis / p7 (0016.jp2)
  7. Clapter 2 Design Consideration of GaInAsP/InP Surface Emitting Lasers / p19 (0028.jp2)
  8. 2.1 Basic Structure / p20 (0029.jp2)
  9. 2.2 Design of GaInAsP/InP Surfase Emitting Lasers / p21 (0030.jp2)
  10. Capter 3 Reflector Design for Surface Emitting Lasers / p32 (0041.jp2)
  11. 3.1 Reflectors for Surface Emitting Lasers / p33 (0042.jp2)
  12. 3.2 Multilayer Reflector Design / p34 (0043.jp2)
  13. Chapter 4 Electron Beam Evaporation for Multilayer Reflectors / p57 (0066.jp2)
  14. 4.1 Electron Beam Evaporator / p58 (0067.jp2)
  15. 4.2 Thickness Control Technique / p60 (0069.jp2)
  16. 4.3 Multilayer Evaporation by Electron Beam Evaporator / p65 (0074.jp2)
  17. Chapter 5 Characterization of Evaporated Mirrors / p80 (0089.jp2)
  18. 5.1 Absorption Loss Estimation / p81 (0090.jp2)
  19. 5.2 Reflectivity Estimation / p82 (0091.jp2)
  20. Chapter 6 Threshold Current Density Reduction by High Reflective Mirrorrs / p96 (0105.jp2)
  21. 6.1 Application of Si/SiO₂ Multilayer in its infancy / p97 (0106.jp2)
  22. 6.2 Application of Si/SiO₂ Multilayer by Optical Monitoring / p101 (0110.jp2)
  23. Chapter 7 Performances of GaInAsP/InP Surface Emitting Lasers / p119 (0128.jp2)
  24. 7.1 Temperature Characteristics / p120 (0129.jp2)
  25. Chapter 8 Considerations / p124 (0133.jp2)
  26. Chapter 9 Conclusions / p136 (0145.jp2)
  27. Acknowledgments / (0149.jp2)
  28. Publication List / (0147.jp2)
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Codes

  • NII Article ID (NAID)
    500000088409
  • NII Author ID (NRID)
    • 8000000088628
  • DOI(NDL)
  • NDLBibID
    • 000000252723
  • Source
    • NDL ONLINE
    • NDL Digital Collections
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