Studies on the fault diagnosis of analog circuits アナログ回路の故障診断に関する研究
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著者
書誌事項
- タイトル
-
Studies on the fault diagnosis of analog circuits
- タイトル別名
-
アナログ回路の故障診断に関する研究
- 著者名
-
林, 争輝
- 著者別名
-
リン, ツェンフィ
- 学位授与大学
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東京大学
- 取得学位
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博士 (工学)
- 学位授与番号
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乙第10642号
- 学位授与年月日
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1992-03-16
注記・抄録
博士論文
目次
- Contents / (0003.jp2)
- Chapter 1 Introduction / p1 (0004.jp2)
- 1-1 Backgroud of This Work / p1 (0004.jp2)
- 1-2 Motivations and Objectives of This Work / p11 (0009.jp2)
- 1-3 Synopese of Chapters / p17 (0012.jp2)
- References / p22 (0015.jp2)
- Chapter 2 Fundamentals of Fault Diagnosis / p29 (0018.jp2)
- 2-1 The Area of Analog Circuit Fault Diagnosis / p29 (0018.jp2)
- 2-2 Basic Concepts and Definitions / p31 (0019.jp2)
- 2-3 Historical Survey with Circuit and System Theory / p35 (0021.jp2)
- References / p47 (0027.jp2)
- Chapter 3 Fault Diagnosis of Linear Circuits / p51 (0029.jp2)
- 3-1 Fault-Excitation Theory / p51 (0029.jp2)
- 3-2 To Solve the Location Problem / p62 (0035.jp2)
- 3-3 To Solve the Identification Problem / p67 (0037.jp2)
- 3-4 Applied Example / p69 (0038.jp2)
- 3-5 Conclusion / p70 (0039.jp2)
- References / p71 (0039.jp2)
- Chapter 4 Fault Diagnosis of Active Circuits / p72 (0040.jp2)
- 4-1 Costitutive Relation of General Active Branch / p72 (0040.jp2)
- 4-2 Topological Analysis of Active Circuits / p74 (0041.jp2)
- 4-3 Diagnosis Equation for Active Circuits / p82 (0045.jp2)
- 4-4 Applied Example / p94 (0051.jp2)
- 4-5 Conclusion / p96 (0052.jp2)
- References / p96 (0052.jp2)
- Chapter 5 Fault Diagnosis of Dynamic and Nonlinear Circuits / p97 (0052.jp2)
- 5-1 General Idea and Principle / p97 (0052.jp2)
- 5-2 Solution of General Diagnosis Equation / p103 (0055.jp2)
- 5-3 Diagnosis for Linear Case / p104 (0056.jp2)
- 5-4 Diagnosis for Dynamic Case / p106 (0057.jp2)
- 5-5 Diagnosis for Nolinear Case / p111 (0059.jp2)
- 5-6 Applied Examples / p115 (0061.jp2)
- 5-7 Conclusion / p120 (0064.jp2)
- References / p121 (0064.jp2)
- Chapter 6 Diagnosability and Testability / p123 (0065.jp2)
- 6-1 The Concept of Local Diagnosability / p123 (0065.jp2)
- 6-2 Diagnosability and Testability of Linear Circuits / p123 (0065.jp2)
- 6-3 Diagnosability and Testability of Dynamic Circuits / p129 (0068.jp2)
- 6-4 Diagnosability and Testability of Nonlinear Circuits / p136 (0072.jp2)
- 6-5 A Typical Problem-Diagnosability and Testability of Single Branch Fault / p138 (0073.jp2)
- 6-6 Conclusion / p142 (0075.jp2)
- References / p143 (0075.jp2)
- Chapter 7 A Diagnosis Approach Based on New Fundamentals / p145 (0076.jp2)
- 7-1 Network Variable Equation-New Fundamentals / p145 (0076.jp2)
- 7-2 Analog Circuit Fault Location Approach / p153 (0080.jp2)
- 7-3 Analog Circuit Fault Identification Approch / p159 (0083.jp2)
- 7-4 Applied Example / p161 (0084.jp2)
- 7-5 Conclusion / p171 (0089.jp2)
- References / p172 (0090.jp2)
- Chapter 8 Summary Conclusion and Recommendation / p174 (0091.jp2)
- 8-1 Summary / p174 (0091.jp2)
- 8-2 Conlusion / p175 (0091.jp2)
- 8-3 Recommendation / p178 (0093.jp2)
- References / p180 (0094.jp2)
- Appendix(Publications) / (0094.jp2)
- Acknowledgement / (0097.jp2)