Ultrafast electro-optic measurement based on semiconductor lasers 半導体レーザを用いた超高速電気光学計測に関する研究
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Bibliographic Information
- Title
-
Ultrafast electro-optic measurement based on semiconductor lasers
- Other Title
-
半導体レーザを用いた超高速電気光学計測に関する研究
- Author
-
高橋, 亮
- Author(Another name)
-
タカハシ, リョウ
- University
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東京大学
- Types of degree
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博士 (工学)
- Grant ID
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甲第9478号
- Degree year
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1992-03-30
Note and Description
博士論文
Table of Contents
- CONTENTS / p1 (0003.jp2)
- Chapter1 Introduction / p1 (0006.jp2)
- 1.1 General Motivation / p2 (0007.jp2)
- 1.2 Optical Sampling / p3 (0008.jp2)
- 1.3 Electrooptic Sampling / p4 (0009.jp2)
- 1.4 Background and Objective of This Work / p19 (0024.jp2)
- 1.5 Outline of the Thesis / p20 (0025.jp2)
- Chapter2 Measurement Systems Considerations and Probe Beam Polarization Modulation Scheme / p21 (0027.jp2)
- 2.1 Introductory Remarks / p22 (0028.jp2)
- 2.2 Fabrication of Desk-top Electrooptic Sampling System / p26 (0032.jp2)
- 2.3 Proposal of Novel Modulation Schemes / p30 (0036.jp2)
- 2.4 Comparative Measurement between Beat and polarization Modulation Schemes / p39 (0045.jp2)
- 2.5 Concluding Remarks / p43 (0049.jp2)
- Chapter3 Temporal Resolution Enhancement by means of Optical Pulse Compression / p44 (0050.jp2)
- 3.1 Introductory Remarks / p45 (0051.jp2)
- 3.2 Limiting Factors on Temporal Resolution / p47 (0053.jp2)
- 3.3 Pulse-to-pulse Timing Jitter / p50 (0056.jp2)
- 3.4 Optical Pulse Compression / p59 (0065.jp2)
- 3.5 Concluding Remarks / p79 (0085.jp2)
- Appendix / p79 (0085.jp2)
- Chapter4 Application of an Optical Amplifier to Electrooptic Sampling Systems / p81 (0087.jp2)
- 4.1 Introductory Remarks / p82 (0088.jp2)
- 4.2 Noise Characteristics of Optical Amplifiers / p83 (0089.jp2)
- 4.3 Theory of EO sampling Sensitivity Using an Optical Amplifier / p85 (0091.jp2)
- 4.4 Experimental Results on Sensitivity Improvement / p98 (0104.jp2)
- 4.5 Discussions / p109 (0115.jp2)
- 4.6 Concluding Remarks / p113 (0119.jp2)
- Chapter5 CW Electrooptic Probing / p115 (0120.jp2)
- 5.1 Introductory Remarks / p116 (0121.jp2)
- 5.2 Field Mapping Measurement in a GaAs Substrate / p117 (0122.jp2)
- 5.3 Side-Gating Effects and Potential Distribution / p125 (0130.jp2)
- 5.4 Concluding Remarks / p133 (0138.jp2)
- Chapter6 Conclusions / p134 (0139.jp2)
- Acknowledgements / p139 (0144.jp2)
- References / p142 (0147.jp2)
- Publications / p153 (0158.jp2)