Study of thin epitaxial multilayer structures by scanning tunneling microscope 走査型トンネル顕微鏡による薄膜結晶多層構造の研究
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著者
書誌事項
- タイトル
-
Study of thin epitaxial multilayer structures by scanning tunneling microscope
- タイトル別名
-
走査型トンネル顕微鏡による薄膜結晶多層構造の研究
- 著者名
-
加藤, 隆志
- 著者別名
-
カトウ, タカシ
- 学位授与大学
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大阪大学
- 取得学位
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博士 (工学)
- 学位授与番号
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乙第6858号
- 学位授与年月日
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1996-02-22
注記・抄録
博士論文
目次
- ABSTRACT / p1 (0003.jp2)
- CONTENTS / p4 (0006.jp2)
- CHAPTER1 GENERAL INTRODUCTION / p1 (0009.jp2)
- 1.1 Background of the Study / p1 (0009.jp2)
- 1.2 Purpose of the Dissertation / p5 (0013.jp2)
- References / p6 (0014.jp2)
- CHAPTER2 SCANNING TUNNELING MICROSCOPE(STM) / p9 (0017.jp2)
- 2.1 Principle of STM / p9 (0017.jp2)
- 2.2 Technical Problems and Solutions for the Observation of Thin Epitaxial Multilayer Structures / p12 (0020.jp2)
- 2.3 Scanning Tunneling Microscopy/Spectroscopy System for Multilayer Observations in Air / p16 (0024.jp2)
- 2.4 Ultra-high Vacuum STM System / p22 (0030.jp2)
- 2.5 Conclusion / p35 (0043.jp2)
- References / p36 (0044.jp2)
- CHAPTER3 OBSERVATION OF THIN EPITAXIAL MULTILAYER STRUCTURES BY STM IN AIR / p39 (0047.jp2)
- 3.1 STM of Multiquantum Well (MQW) structure / p39 (0047.jp2)
- 3.2 STM of Thin n-GaAs/p-GaAs Multilayer Structure / p55 (0063.jp2)
- 3.3 Conclusion / p64 (0072.jp2)
- References / p65 (0073.jp2)
- CHAPTER4 OBSERVATION OF GaInAs/InP MQW STRUCTURES BY STM IN ULTRA-HIGH VACUUM / p66 (0074.jp2)
- 4.1 STM Images of GaInAs/InP MQW Structure / p66 (0074.jp2)
- 4.2 Shape of the GaInAs/InP MQW Potential / p73 (0081.jp2)
- 4.3 Analysis of Voltage-dependent STM Image of GaInAs/InP MQW Structure / p78 (0086.jp2)
- 4.4 Conclusion / p89 (0097.jp2)
- References / p90 (0098.jp2)
- SUMMARY / p91 (0099.jp2)
- ACKNOWLEDGMENTS / p93 (0101.jp2)
- APPENDIX / p94 (0102.jp2)
- List of publications / p94 (0102.jp2)
