Correlation between energy loss and charge exchange of silicon ions in carbon foils Siイオンの炭素薄膜中に於けるエネルギー損失と荷電変換の相関
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著者
書誌事項
- タイトル
-
Correlation between energy loss and charge exchange of silicon ions in carbon foils
- タイトル別名
-
Siイオンの炭素薄膜中に於けるエネルギー損失と荷電変換の相関
- 著者名
-
山口, 秀則
- 著者別名
-
ヤマグチ, ヒデノリ
- 学位授与大学
-
筑波大学
- 取得学位
-
理学博士
- 学位授与番号
-
甲第179号
- 学位授与年月日
-
1983-03-25
注記・抄録
博士論文
1982
【要旨】
目次
- Abstract / (0003.jp2)
- Contents / (0005.jp2)
- 1.Introduction / p1 (0007.jp2)
- 2.Experimental Method / p7 (0013.jp2)
- 2.1 General description / p7 (0013.jp2)
- 2.2 Production and acceleration of silicon ions / p9 (0015.jp2)
- 2.3 Production of faint beam / p10 (0016.jp2)
- 2.4 Post stripper / p12 (0018.jp2)
- 2.5 Detection system / p14 (0020.jp2)
- 3.Results and Analyses / p17 (0023.jp2)
- 3.1 Thickness dependence of charge state fractions / p17 (0023.jp2)
- 3.2 Thickness dependence of charge changing cross sections / p19 (0025.jp2)
- 3.3 Determination of charge changing cross sections / p23 (0029.jp2)
- 3.4 K X-ray emission cross sections / p26 (0032.jp2)
- 3.5 Energy transfer associated with charge changing collisions / p28 (0034.jp2)
- 3.6 Thickness dependence of rate of energy loss / p33 (0039.jp2)
- 4.Discussion / p35 (0041.jp2)
- 4.1 Charge exchange / p35 (0041.jp2)
- 4.2 Comparison with the exsisting theories / p39 (0045.jp2)
- 4.3 Stopping of partially stripped ions / p42 (0048.jp2)
- 5.Conclusion / p49 (0055.jp2)
- Acknowledgements / (0057.jp2)
- Appendix / A-1 / (0058.jp2)
- A-I Calibration of position signal from PSD / A-1 / (0058.jp2)
- A-II Determination of charge changing cross section by the method of least squares / A-7 / (0064.jp2)
- A-III Calibration of position signal from PSD / A-10 / (0067.jp2)
- A-IV Uncertainty in energy loss measurement / A-12 / (0069.jp2)
- A-V Energy loss associated with charge exchange and excitation of a projectile ion / A-14 / (0071.jp2)
- References / (0074.jp2)
- Tables / (0077.jp2)
- Figure captions / (0089.jp2)
- Figures / (0094.jp2)
