Preparation and characterization of ferroelectric YMnO3 thin films by the sol-gel method ゾルーゲル法による強誘電体YMnO3薄膜の作製と特性評価

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著者

    • 北畠, 裕也 キタハタ, ヒロヤ

書誌事項

タイトル

Preparation and characterization of ferroelectric YMnO3 thin films by the sol-gel method

タイトル別名

ゾルーゲル法による強誘電体YMnO3薄膜の作製と特性評価

著者名

北畠, 裕也

著者別名

キタハタ, ヒロヤ

学位授与大学

大阪府立大学

取得学位

博士 (工学)

学位授与番号

甲第603号

学位授与年月日

2000-03-31

注記・抄録

博士論文

目次

  1. Contents / (0003.jp2)
  2. 1. General introduction / p1 (0005.jp2)
  3. 2. Effects of reflux of coating solution on the crystallization process and dielectric properties of YMnO₃ thin films / p12 (0016.jp2)
  4. 2-1. Introduction / p12 (0016.jp2)
  5. 2-2 Experimental / p13 (0017.jp2)
  6. 2-3 Results and Discussion / p16 (0020.jp2)
  7. 2-4. Summary / p21 (0025.jp2)
  8. 2-5 References / p22 (0026.jp2)
  9. 3. Effects of the Y/Mn ratio on the microstructure and dielectric properties of YMnO₃ thin films / p23 (0027.jp2)
  10. 3-1. Introduction / p23 (0027.jp2)
  11. 3-2 Experimental / p23 (0027.jp2)
  12. 3-3 Results and Discussion / p24 (0028.jp2)
  13. 3-4. Summary / p32 (0036.jp2)
  14. 3-5 References / p34 (0038.jp2)
  15. 4. Preparation and ferroelectric properties of YMnO₃ thin films with c-axis preferred orientation / p35 (0039.jp2)
  16. 4-1 Preparation of YMnO₃ thin films with c-axis preferred orientation / p35 (0039.jp2)
  17. 4-2 Effects of heat treatment conditions on the microstructure, leakage current and ferroelectricity of YMnO₃ thin films with c-axis preferred orientation / p44 (0049.jp2)
  18. 5. Lowering the crystallization temperature of YMnO₃ thin films prepared from an yttrium alkoxide / p59 (0064.jp2)
  19. 5-1. Introduction / p59 (0064.jp2)
  20. 5-2 Experimental / p60 (0065.jp2)
  21. 5-3 Results and Discussion / p61 (0066.jp2)
  22. 5-4. Summary / p70 (0075.jp2)
  23. 5-5 References / p71 (0076.jp2)
  24. 6. Origin of leakage current of YMnO₃ thin films prepared by the sol-gel method / p73 (0078.jp2)
  25. 6-1. Introduction / p73 (0078.jp2)
  26. 6-2 Experimental / p74 (0079.jp2)
  27. 6-3 Results and Discussion / p75 (0080.jp2)
  28. 6-4. Summary / p84 (0089.jp2)
  29. 6-5 References / p86 (0091.jp2)
  30. 7. General conclusions / p87 (0092.jp2)
  31. Acknowledgments / p91 (0096.jp2)
  32. List of Publications / p92 (0097.jp2)
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各種コード

  • NII論文ID(NAID)
    500000186726
  • NII著者ID(NRID)
    • 8000000187009
  • DOI(NDL)
  • NDL書誌ID
    • 000000351040
  • データ提供元
    • NDL ONLINE
    • NDLデジタルコレクション
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