Effects of OH on structural relaxations in silica glass シリカガラスの構造緩和に及ぼすOHの効果

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Author

    • 垣内田, 洋 カキウチダ, ヒロシ

Bibliographic Information

Title

Effects of OH on structural relaxations in silica glass

Other Title

シリカガラスの構造緩和に及ぼすOHの効果

Author

垣内田, 洋

Author(Another name)

カキウチダ, ヒロシ

University

豊田工業大学

Types of degree

博士 (工学)

Grant ID

甲第17号

Degree year

2000-09-27

Note and Description

博士論文

Table of Contents

  1. Contents / p3 (0004.jp2)
  2. Abstract / p15 (0010.jp2)
  3. Japanese abstract / p19 (0012.jp2)
  4. 1 Introduction / p1 (0014.jp2)
  5. 1.1 Physical properties of silica glass / p2 (0015.jp2)
  6. 1.2 Glass-forming process / p4 (0016.jp2)
  7. 1.3 Impurity effects on structural relaxation / p7 (0017.jp2)
  8. 1.4 Objective and composition of the present thesis / p9 (0018.jp2)
  9. 2 Effects of OH on structural relaxation / p31 (0029.jp2)
  10. 2.1 Introduction / p32 (0030.jp2)
  11. 2.2 Experimental procedures / p33 (0030.jp2)
  12. 2.3 Results / p35 (0031.jp2)
  13. 2.4 Discussion / p38 (0033.jp2)
  14. 2.5 Summary / p42 (0035.jp2)
  15. 3 Elementary process of structural relaxation / p57 (0042.jp2)
  16. 3.1 Introduction / p58 (0043.jp2)
  17. 3.2 Experimental procedures / p59 (0043.jp2)
  18. 3.3 Results / p61 (0044.jp2)
  19. 3.4 Discussion / p64 (0046.jp2)
  20. 3.5 Summary / p68 (0048.jp2)
  21. 4 Local structural relaxation / p81 (0054.jp2)
  22. 4.1 Introduction / p82 (0055.jp2)
  23. 4.2 OH vibrational mode and structural change around OH / p83 (0055.jp2)
  24. 4.3 Experimental procedures / p85 (0056.jp2)
  25. 4.4 Results / p88 (0058.jp2)
  26. 4.5 Discussion / p90 (0059.jp2)
  27. 4.6 Summary / p92 (0060.jp2)
  28. 5 Summary and conclusion / p109 (0068.jp2)
  29. A Measurement of the Rayleigh scattering / p115 (0071.jp2)
  30. A.1 Origins of light scattering / p115 (0071.jp2)
  31. A.2 Removal of affection by thermal radiation / p118 (0073.jp2)
  32. B Thickness dependence of dielectric relaxation / p121 (0074.jp2)
  33. C dc electrical conductivity / p124 (0076.jp2)
  34. C.1 Contribution of OH to dc electrical conductivity / p124 (0076.jp2)
  35. C.2 Contribution of other impurities to dc electrical conductivity / p125 (0076.jp2)
  36. List of publications / p131 (0079.jp2)
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Codes

  • NII Article ID (NAID)
    500000197220
  • NII Author ID (NRID)
    • 8000000197523
  • DOI(NDL)
  • Text Lang
    • eng
  • NDLBibID
    • 000000392328
  • Source
    • NDL ONLINE
    • NDL Digital Collections

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