Embedded-atom method: Derivation and application to impurities, surfaces, and other defects in metals

• Murray S. Daw

• M. I. Baskes

収録刊行物

• Physical Review B

  Physical Review B 29 (12), 6443-6453, 1984-06-15

  American Physical Society (APS)

詳細情報

• CRID: 1360011144315444736
• NII論文ID: 80002229870
• NII書誌ID: AA00773566
• DOI: 10.1103/physrevb.29.6443
• ISSN: 01631829
• Web Site: http://link.aps.org/article/10.1103/PhysRevB.29.6443
• Web Site: http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.29.6443/fulltext
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