New method to measure the source and drain resistance of the GaAs MESFET
Journal
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- IEEE Electron Device Lett.
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IEEE Electron Device Lett. 7 75-77, 1986
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Details 詳細情報について
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- CRID
- 1570572701699794304
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- NII Article ID
- 80002779081
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- Data Source
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- CiNii Articles