Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution

• Y. Martin

  IBM T. J. Watson Research Center, P. O. Box 218, Yorktown Heights, New York 10598

• H. K. Wickramasinghe

  IBM T. J. Watson Research Center, P. O. Box 218, Yorktown Heights, New York 10598

抄録

We describe a new method for imaging magnetic fields with 1000 Å resolution. The technique is based on using a force microscope to measure the magnetic force between a magnetized tip and the scanned surface. The method shows promise for the high-resolution mapping of both static and dynamic magnetic fields.

収録刊行物

• Applied Physics Letters

  Applied Physics Letters 50 (20), 1455-1457, 1987-05-18

  AIP Publishing

キーワード

• Physics and Astronomy (miscellaneous)

詳細情報

• CRID: 1362544420816185728
• NII論文ID: 80003480044
• DOI: 10.1063/1.97800
• ISSN: 10773118
• ISSN: 00036951
• Web Site: https://pubs.aip.org/aip/apl/article-pdf/50/20/1455/18461285/1455_1_online.pdf
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