Determination of the critical layer thickness of Si_<1-x>Ge_x/Si heterostructures by direct observation of misfit dislocations

• KOHAMA Y.

収録刊行物

• Appl. Phys. Lett.

  Appl. Phys. Lett. 52 380-, 1988

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• CRID: 1572261551544526080
• NII論文ID: 80003792698
• データソース種別:
  • CiNii Articles