A free-space method for measurement of dielectric constants and loss tangents at microwave frequencies

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Journal

  • IEEE Trans. IM

    IEEE Trans. IM 37(3), 789-793, 1989

Cited by:  33

Codes

  • NII Article ID (NAID)
    80004946874
  • Article Type
    Journal Article
  • Data Source
    CJPref 
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