Formation and diffusion properties of oxide films on metals and on nitride coatings studied with Auger electron spectroscopy and X-ray photoelectron spectroscopy

• S Hofmann

収録刊行物

• Thin Solid Films

  Thin Solid Films 193-194 648-664, 1990-12

  Elsevier BV

キーワード

• Materials Chemistry
• Metals and Alloys
• Surfaces, Coatings and Films
• Surfaces and Interfaces
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1360299768404150912
• NII論文ID: 80005726040
• DOI: 10.1016/0040-6090(90)90216-z
• ISSN: 00406090
• Web Site: https://api.elsevier.com/content/article/PII:004060909090216Z?httpAccept=text/xml
• Web Site: https://api.elsevier.com/content/article/PII:004060909090216Z?httpAccept=text/plain
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