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- M. Nonnenmacher
- T. J. Watson Research Center, IBM, Yorktown Heights, New York 10598
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- M. P. O’Boyle
- T. J. Watson Research Center, IBM, Yorktown Heights, New York 10598
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- H. K. Wickramasinghe
- T. J. Watson Research Center, IBM, Yorktown Heights, New York 10598
抄録
<jats:p>Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension (<50 nm) and allows the simultaneous imaging of topography and contact potential difference. Images of gold, platinum, and palladium surfaces, taken in air, show a large contrast in the contact potential difference and demonstrate the basic concept.</jats:p>
収録刊行物
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- Applied Physics Letters
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Applied Physics Letters 58 (25), 2921-2923, 1991-06-24
AIP Publishing
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詳細情報
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- CRID
- 1361981471245884800
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- NII論文ID
- 80005957987
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- DOI
- 10.1063/1.105227
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- ISSN
- 10773118
- 00036951
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- データソース種別
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- Crossref
- CiNii Articles