Kelvin probe force microscopy

• M. Nonnenmacher

  T. J. Watson Research Center, IBM, Yorktown Heights, New York 10598

• M. P. O’Boyle

  T. J. Watson Research Center, IBM, Yorktown Heights, New York 10598

• H. K. Wickramasinghe

  T. J. Watson Research Center, IBM, Yorktown Heights, New York 10598

抄録

Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension (<50 nm) and allows the simultaneous imaging of topography and contact potential difference. Images of gold, platinum, and palladium surfaces, taken in air, show a large contrast in the contact potential difference and demonstrate the basic concept.

収録刊行物

• Applied Physics Letters

  Applied Physics Letters 58 (25), 2921-2923, 1991-06-24

  AIP Publishing

キーワード

• Physics and Astronomy (miscellaneous)

詳細情報

• CRID: 1361981471245884800
• NII論文ID: 80005957987
• DOI: 10.1063/1.105227
• ISSN: 10773118
• ISSN: 00036951
• Web Site: https://pubs.aip.org/aip/apl/article-pdf/58/25/2921/18483018/2921_1_online.pdf
• データソース種別:
  • Crossref
  • CiNii Articles