Scanning electron microscopy of negatively stained catalase on a silicon wafer.

• FURUNO T.

収録刊行物

• Microsc. Res. Tech.

  Microsc. Res. Tech. 21 32-38, 1992

詳細情報

• CRID: 1571417126659774208
• NII論文ID: 80006517011
• NII書誌ID: AA1082314X
• データソース種別:
  • CiNii Articles