Recursive Learning : An Attractive Alternative to the Decision Tree for Test Genration in Digital Circuits

Author(s)

Journal

  • Proc. IEEE International Test Conference on Discover the New World of Test and Design, 1992

    Proc. IEEE International Test Conference on Discover the New World of Test and Design, 1992, 816-825, 1992

Cited by:  7

Codes

  • NII Article ID (NAID)
    80006839578
  • Article Type
    Proceedings
  • Data Source
    CJPref 
Page Top