Open-ended rectangular waveguide for nondestructive thickness measurement and variation detection of lossy dielectric slabs backed by a conducting plate

• S. Bakhtiari

• S.I. Ganchev

• R. Zoughi

収録刊行物

• IEEE Transactions on Instrumentation and Measurement

  IEEE Transactions on Instrumentation and Measurement 42 (1), 19-24, 1993

  Institute of Electrical and Electronics Engineers (IEEE)

キーワード

• Electrical and Electronic Engineering
• Instrumentation

詳細情報

• CRID: 1360579817909166976
• NII論文ID: 80006992597
• NII書誌ID: AA00667922
• DOI: 10.1109/19.206673
• ISSN: 00189456
• Web Site: http://xplorestaging.ieee.org/ielx1/19/5289/00206673.pdf?arnumber=206673
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