Experimental results and modeling techniques for substrate noise in mixed-signal integrated circuits

• D.K. Su

• M.J. Loinaz

• S. Masui

• B.A. Wooley

収録刊行物

• IEEE Journal of Solid-State Circuits

  IEEE Journal of Solid-State Circuits 28 (4), 420-430, 1993-04

  Institute of Electrical and Electronics Engineers (IEEE)

キーワード

• Electrical and Electronic Engineering

詳細情報

• CRID: 1360282588979714304
• NII論文ID: 80007033942
• DOI: 10.1109/4.210024
• ISSN: 00189200
• Web Site: http://xplorestaging.ieee.org/ielx1/4/5447/00210024.pdf?arnumber=210024
• データソース種別:
  • Crossref
  • CiNii Articles