Vacuum Breakdown Strength of Vacuum-degassed oxygen -free Copper Electrodes
Journal
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- IEEE Trans.Electrical Insulation
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IEEE Trans.Electrical Insulation 28 (4), 1993
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Details 詳細情報について
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- CRID
- 1571698601624782720
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- NII Article ID
- 80007253595
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- Data Source
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- CiNii Articles