A transitive closure algorithm for test generation

• CHAKRADHAR S.

収録刊行物

• IEEE Trans. Comput. Aided Design

  IEEE Trans. Comput. Aided Design 12 (7), 1015-1028, 1993

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• CRID: 1573387451484661120
• NII論文ID: 80007266956
• データソース種別:
  • CiNii Articles