Measurement and modeling of MOS transistor current mismatch in analog IC's
Journal
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- IEEE Proc. ICCAD'94
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IEEE Proc. ICCAD'94 272-277, 1994
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Details 詳細情報について
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- CRID
- 1573668926486924928
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- NII Article ID
- 80008123637
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- Data Source
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- CiNii Articles