Reflection-mode near-field optical microscope with a metallic probe tip for observing fine structures in semiconductor materials
収録刊行物
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- Opt. Commun.
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Opt. Commun. 134 31-, 1997
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詳細情報
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- CRID
- 1570009750901920128
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- NII論文ID
- 80009480495
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- データソース種別
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- CiNii Articles