Development of High-Resolution Probe for Scanning Acoustic Tomographs of Electronic Parts

• TAKEUCHI K.

Journal

• ASME ADVANCES ELECTRONICS PACKAGING 1997

  ASME ADVANCES ELECTRONICS PACKAGING 1997 1 1183-1190, 1997

Details

• CRID: 1570854175834606464
• NII Article ID: 80009806780
• Data Source:
  • CiNii Articles