Dynamical process of defect clustering in Ni under the irradiation with low energy helium ions.

• ONO K.

収録刊行物

• J. Nucl. Mater.

  J. Nucl. Mater. 271 214-219, 1998

詳細情報

• CRID: 1573668926507891968
• NII論文ID: 80011147665
• データソース種別:
  • CiNii Articles