A new five-parameter MOS transistor mismatch model
Journal
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- IEEE Electron Device Lett.
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IEEE Electron Device Lett. 21 (1), 37-39, 2000
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Details 詳細情報について
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- CRID
- 1570854176740339968
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- NII Article ID
- 80011433670
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- Data Source
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- CiNii Articles