Raman sepectroscopic and atomic force microscopic study of graphite ablation at 193 and 248 nm

• MECHLER A.

収録刊行物

• Appl. Surf. Sci.

  Appl. Surf. Sci. 154 22-28, 2000

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• CRID: 1572824501580719488
• NII論文ID: 80011454364
• データソース種別:
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