Si/SiO_2 interface roughness study using Fowler-Nordheim tunneling current oscillations
Journal
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- J. Appl. Phys.
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J. Appl. Phys. 87 (3), 1159-1164, 2000
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Details 詳細情報について
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- CRID
- 1571135651715521792
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- NII Article ID
- 80011466417
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- Data Source
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- CiNii Articles