Characterization of the MIC/MILC interface and its effects on the performance of MILC thin-film transistors

• WONG M.

収録刊行物

• IEEE Trans. Electron Devices

  IEEE Trans. Electron Devices 47 1061-1067, 2000

詳細情報

• CRID: 1572261551622479488
• NII論文ID: 80011807265
• データソース種別:
  • CiNii Articles