High-frequency analysis of linearity improvement technique of common-emitter transconductance stage using a low-frequency-trap network

• FONG K. L.

収録刊行物

• IEEE J. Solid-State Circuits

  IEEE J. Solid-State Circuits 2000

詳細情報

• CRID: 1572824501574689536
• NII論文ID: 80011951567
• データソース種別:
  • CiNii Articles