Current Status and Future Trends of SiGe BiCMOS Technology

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Author(s)

Journal

  • IEEE. Trans. Electron Device

    IEEE. Trans. Electron Device 48, 2575-2594, 2001

Cited by:  13

Codes

  • NII Article ID (NAID)
    80012877541
  • Article Type
    Journal Article
  • Data Source
    CJPref 
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