Thick specimens in the CEM and STEM. I. Contrast

• CREWE A. V.

Journal

• J. Appl. Phys.

  J. Appl. Phys. 45 3662-3672, 1974

Details

• CRID: 1573668926253223168
• NII Article ID: 80013013059
• NII Book ID: AA00693547
• Data Source:
  • CiNii Articles